Title: Effect of SiO2 Thickness Variation on Threshold Voltage and Trans-Conductance of TFT
Authors:
Abhinandan Jain
abbhinandan.jain@skit.ac.in
Department of Electronics and Communication Engineering, Swami Keshvanand Institute of Technology, Management & Gramothan, Jaipur, Rajasthan (INDIA),
Lalit Kumar Lata
lalit.lata2008@gmail.com
Department of Electronics and Communication Engineering, Swami Keshvanand Institute of Technology, Management & Gramothan, Jaipur, Rajasthan (INDIA),
Praveen Kumar Jain
praveenjain.spsl@gmail.com
Department of Electronics and Communication Engineering, Swami Keshvanand Institute of Technology, Management & Gramothan, Jaipur, Rajasthan (INDIA),
Archana Jain
archana@gmail.com
Department of Electronics and Communication Engineering, Swami Keshvanand Institute of Technology, Management & Gramothan, Jaipur, Rajasthan (INDIA)